13–17 Sept 2021 Virtual Conference
Virtual
Europe/Vienna timezone
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Expanding Design Possibilities by Blurred Electron Beams during 3D Nanoprinting

Not scheduled
3m
Virtual

Virtual

Poster C1. Additive manufacturing processes and modelling (incl. C2 & D10) C1_Poster Session

Speaker

Mr Lukas Seewald (Graz University of Technology - Institute of Electron Microscopy and Nanoanalysis)

Description

Additive, direct-write manufacturing via focused electron beam has evolved into a reliable 3D nanoprinting technology in recent years. Focused electron beam induced deposition (FEBID) bases on the highly localized immobilization of surface adsorbed precursor molecules by focused electron beams and its subsequent processes. As the precursor is injected in gaseous states, this technology has low demands on substrate materials (vacuum and e-beam compatible) and surface morphology (accessible by the electron beam). By the controlled movement of the electron beam, FEBID allows the fabrication of even complex 3D structures with nanoscale features down to the sub-20 nm range. While current trends focus on closed and even bulky 3D designs, most 3D-FEBID structures in the past used meshed objects, meaning a combination of differently oriented branches, connected at some points in 3D space according to the final application. While inherently required for some concepts (e.g. 3D nano-plasmonics or magnetic lattices), the small diameters can also limit final applicability due to low mechanical rigidity, thermal or electric conductivities. To optimize those properties without changing the general 3D design type, a controlled way for tuning individual branch diameters would be highly desirable. Following that motivation, we here introduce on-purpose beam blurring for a controlled upward scaling and study the behavior at different inclination angles. Aside the intended diameter tunability, the study reveals a massive boost in growth efficiencies up to factor 5 due to strongly changed working regime conditions. As a consequence of the latter, unwanted proximal growth beneath overhanging 3D branches is strongly reduced, which increases the reliability of 3D-FEBID. By that, the study expands the design flexibility of this technology by means of tunable diameters for meshed objects at higher volume growth rates and reduced proximal growth.

Speaker Country Austria

Author

Mr Lukas Seewald (Graz University of Technology - Institute of Electron Microscopy and Nanoanalysis)

Co-authors

Prof. Gerald Kothleitner (Graz University of Technology - Institute of Electron Microscopy and Nanoanalysis) Prof. Harald Plank (Graz University of Technology - Institute of Electron Microscopy and Nanoanalysis) Dr Robert Winkler (Graz University of Technology - Institute of Electron Microscopy and Nanoanalysis)

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