Dr
Eindhoven University of Technology
Author in the following contributions
- Microscale damage prediction enables high-resolution in-situ measurement of plasticity-to-damage in Dual-Phase steels
- Microstructure characterization of multiwalled 316L Wire Arc Additive Manufacturing, analyzed with a novel average microstructure cell extraction method
- Pushing the limits of SEM-DIC: resolving microstructure-correlated strain fields at the nanoscale
- Accurate strain field measurement during strip rolling by a novel Integrated Digital Image Correlation framework