Speaker
Description
Two-dimensional materials are the ideal samples for transmission
electron microscopy (TEM) because of their intrinsically thin structure.
Indeed, TEM has been instrumental in revealing the atomic structure of
these materials, including their defects and impurities. More
counter-intuitive is the possibility to also study the corrugation of 2D
materials through TEM. Nevertheless, it has been shown that a series of
electron diffraction patterns recorded at different sample tilts allows
measuring the roughness and average inclination in mono- and bilayer
graphene [1,2], as well as van der Waals heterostructures [3].
However, until now, no comprehensive statistics have been reported on
these values. In this work, we provide a statistical analysis of surface
corrugations in graphene for different sample types and as a function of
the sample size and location. In addition to graphene, we also report
similar values for other 2D materials and their heterostructures.
References
[1] In-Situ Control of Graphene Ripples and Strain in The Electron Microscope, U. Ludacka et al., npj 2D Materials and Applications, 25, (2018).
[2] On the Roughness of Single- and Bi-layer Graphene Membranes, J. C. Meyer et al., Solid State Communication, 143, 101-109 (2007).
[3] Suppression on Roughness in Encapsulated Graphene, Joachim D. Thomsen et al., Phys. Rev. B, 96, 014101 (2017).
| Speaker Country | Austria |
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