Dr
Materials Center Leoben Forschung GmbH (MCL)
Author in the following contributions
- Non‑Destructive 3D Fracture Detection in Pb‑Free Solder Ball Grad Arrays using Micro X Ray Computed Tomography and Image Analysis
- Scarring of Acoustic Waves - Indirect detection of sub micro errors in TSVs at Wafer level
- Advanced microstructural characterization and residual stresses determination for reliable thin films
- Machine Learning Assisted Analysis of Chemical & Micro-Structure Properties in Advanced Si-based Anodes