Dr
Empa, Swiss Federal Laboratories for Materials Science and Technology
Author in the following contributions
- In-situ stress evolution of magnetron-sputtered Cu/W multilayers in dependence of the deposition conditions
- The impact of interface stress on the thermal degradation of Cu/W nano-multilayers
- Depth-resolved strain profiling in metallic thin films and multilayers by grazing in-plane X-ray diffraction
- High-resolution neutron imaging: a new approach to characterize water in engineered Al oxides